wafer test/probe test是什么意思

中文翻译晶圆测试/探针测试

网络释义

1)wafer test/probe test,晶圆测试/探针测试2)Wafer Probe,晶圆测试探针3)wafer probing,晶圆测试，晶圆探测4)test probe,测试探针5)Wafersort,晶圆测试6)Probe test node,探针测试点

Wafer Probe Acquires a New Importance in Testing;

晶圆测试探针新的测试价值

Attach test leads to pins 1 and 2 and note ohmmeter reading.

把测试探针连接到插头1和2，并记下欧姆表读数。

Attach test leads to pins 5 and 6 and note ohmmeter reading.

把测试探针连接到插头5和6，并记下欧姆表读数。

General specification for probe tester

GB/T15394-1994多探针测试台通用技术条件

Researching and Developing of Intelligent Four-Probe Resistivity Meter s;

智能四探针电阻率测试仪研究及开发

The Study of Four-Probe Measurement System Combining with Image Analysis;

结合图像分析的四探针测试系统研究

TESTING AND DISCUSSION ON DRAPE OF CELLULOSE FIBER KNITTED FABRIC

纤维素纤维针织物悬垂性测试与探讨

Development of a four-point probe measuring system based on MCU-51

基于单片机的四探针测试系统的研制

THERE is the nail test, in which a team of engineers drives a large metal nail through a battery cell to see if it explodes.

在一项探针测试中，工程师将金属探针穿过蓄电池来看是否会爆炸。

Study on Fluorone Reageant-(VI) as Spectral Probe for Protein Determination;

荧光酮类试剂—钼（VI）光谱探针测定蛋白质的研究

Applied Research on Built-In-Self-Probe-Test in Object-Oriented Software Testing;

面向对象软件内嵌探针测试的应用研究

The Application of Image Identify in the Micro-Area Four-Probe Testing System;

图像识别在微区四探针测试技术中的应用

Wires running from the tester interface to the probes carry test signals back and forth.

连接测试设备和探针的导线来回的传递测试信号。

Test engineers refer to spring-loaded probes as" nails" and refer to a fixture using spring-loaded probes as a" bed-of-nails" fixture.

测试工程师把带有弹簧的探针当作“钉子”，把带有这种探针的固定装置当作“针床”。

The doctor sounded the bladder.

医生以探针探测膀胱。

Most in-circuit test fixtures use spring-loaded probes and are vacuum actuated.

很多在线测试固定装置是带有弹簧的探针或者采用真空启动的。

Predictions with the Reynolds stress model (RSM) were in reasonable agreement with experimental results measured by intelligent five-hole probe.

计算结果与用五孔探针测试的气相流场实验结果吻合很好。

Study on the Four Point Probe Technique for the Sheet Resistance Measurement of the Micro-Area Integrating with Image Analysis;

结合图像分析的微区薄层电阻四探针测试技术研究

Study on Silicon Sheet s Micro-Area s Resistance Stability Measured by Four Point Probe Method;

用四探针法测试硅片微区薄层电阻的稳定性研究