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thickness measurement是什么意思


中文翻译膜厚测量

网络释义

1)thickness measurement,膜厚测量2)film thickness measurement,膜厚测量3)equipment for measuring thickness of films,膜厚测量仪4)nanometer film thickness measurement,纳米膜厚测量5)Micromeasurement of film thickness,微区膜厚测量6)measurement of thin-film thickness,薄膜厚度测量

用法例句

    Analyzes in detail the principle of thickness measurement of metallic waveguide iris by means of the electromagnetic field theory.

    运用电磁场理论对金属波导膜厚测量的原理进行了详细分析,并且研制了一台膜厚测量仪,理论和实践表明:可以通过测量复合金属波导膜系励磁电流的脉冲波形来控制薄膜的生长厚度。

    Thickness Measurement of In_xGa_(1-x)N Semiconductor Film Based on Reflection Spectra

    基于反射光谱的In_xGa_(1-x)N半导体薄膜厚度测量

    Measuring thin-film thickness with phase-shift interferometry

    基于相位偏移干涉术的薄膜厚度测量方法

    Determination of thickness of plastic film and sheeting by mechanical scanning

    GB/T6672-1986塑料薄膜和薄片厚度的测定机械测量法

    Design of ARM920T-based Online Measuring System for Thickness of Thin Films

    基于ARM920T的薄膜厚度在线测量系统设计

    Investigation into Measuring Nanometer Lubrication Film Thickness by Relative Light Intensity Principle

    相对光强原理测量纳米级润滑薄膜厚度的研究

    Research of Online Noncontact Film-Thickness Measuring System Based on DSP;

    基于DSP的非接触薄膜厚度在线测量系统研究

    Refractive Index and Thickness of Michelson Interferometer Measure Film;

    迈克尔逊干涉仪测量薄膜的折射率与厚度

    Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry

    基于白光干涉的光学薄膜物理厚度测量方法

    The Measurement Based on CCD Method about Thickness of Liquid Films and the Analysis of Break-down Characteristic of Thin Films;

    基于CCD方法的液膜厚度测量及薄膜破断特性的分析

    Film Thickness of the Alpha Energy Loss Measurement and Detection Efficiency γ Spectrum of MCNP Simulation Method Described;

    薄膜厚度的α能损法测量和γ谱探测效率的MCNP模拟描述方法研究

    Research Development of Measurement Methods for Piezoelectric Coefficient of Thin/Thick Film

    薄/厚膜压电参数测量方法的研究进展

    testing method for thickness of plastic film and sheeting

    塑料薄膜和片材的厚度测定法

    THE THICKNESS AND REFACTURE INDEX OF SINGLELAYER FILM MEASURED BY MICHELSON INTERFEROMETER

    用迈克尔逊干涉仪测量单层薄膜的厚度和折射率

    Thickness Measurement of Thin Film on Polycrystalline Preferred Orientation Material by X-Ray Diffraction

    具有择优取向性的基材表面的薄膜厚度的X射线衍射测量修正

    DETERMINATION OF INTERFACE PROPERTIES BETWEEN MICRON-THICK METAL FILM AND CERAMIC SUBSTRATE

    微米厚度金属薄膜/陶瓷基体界面力学性能的实验测量与数值模拟

    Study on Determination of Optical Constants and Thickness of Thin Films by Transmission Spectrum Method;

    薄膜光学常数和厚度的透射光谱法测定研究

    Research on Scanning System for Measuring the Thickness of Plastic Film Based on Capacitive Sensor;

    电容式塑料薄膜厚度扫描检测系统的研究

    Determination of the optical constants and thicknesses of MEH-PPV and PFO thin films

    MEH-PPV和PFO发光薄膜的光学常数和厚度测定